Alignment Mechanism of Nikon Step and Repeat Machine

陈德鹅,吴志明,王军,袁凯,何峰,蒋亚东
DOI: https://doi.org/10.3969/j.issn.1002-2279.2009.06.001
2009-01-01
Microprocessors
Abstract:Reticle and wafer aligning process of Nikon Step and Repeat machine were concretely investigated,including detection of wafer alignment.The misalignment phenomenon of wafer alignment is analysed too,then calculated and compensated for misalignment by EGA algorithm,meanwhile,the reason and relative processing method of misalignment is investigated,which offer solutions to the problems on reticle and wafer alignment.
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