Abstract:The current work investigates the influence of the annealing temperature (373, 473K) on the structural and optical properties of Bi2Te3 thin films produced by the thermal evaporation technique. The crystal structure of samples is examined using an X-ray diffraction, indicating that Bi2Te3 thin films have a Rhombohedral structure with space group R-3m. The crystallite size (D) increased from 10.85 to 14.46 nm by increasing the annealing temperature. Additionally, increasing the annealing temperature reduces the micro-strain and the dislocation density from (3.33x10^(-3) to 2.5x10^(-3)) and (8.49x10^15 to 4.78x10^15 ) Lines⁄m^2 , respectively. These micro-strain and dislocation density reductions refer to the crystallinity enhancement of sample Bi2Te3 thin films. The transmittance and reflectance spectra were measured using an Fourier transform infrared spectrometer. All samples reveal direct and indirect transition types and both direct and indirect optical energy gap decreased with increased annealing temperature from (0.325 to 0.29 eV) and (0.24 to 0.274 eV), respectively. From transmittance and reflectance data, the refractive index is calculated. These results reveal the refractive index decreasing as temperature annealing increased from (2.45 – 1.79) at 3250 nm. Other optical parameters such as absorption index, dielectric constant, energy loss function, and optical conductivity were estimated.

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