Two level core test compression based on partial test vector reuse and VRL coding

Jing-bo SHAO,Guang-sheng MA,Rui-xue ZHANG
DOI: https://doi.org/10.3724/sp.j.1087.2008.00776
2008-01-01
Journal of Computer Applications
Abstract:A new scheme for core based System-on-a-Chip(SoC)test compression was presented.All the test vectors belonging to distinct test sets were partially overlapped to form overlapped vectors as short as possible.Variable-Run-Length(VRL)coding was utilized to further compress the result overlapped test vectors.Due to the fact that test application time is proportional to the length of the overlapped vector,except that the length of the overlapped vector is far smaller than the sum of the length of the original individual test vectors,minimal test application time can be obtained.Compression ratio was maximized through VRL coding.Experimental results indicate that the proposed method achieves reduced test application time and significant compression rate in comparison with the existing methods.
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