Study on Board Level Drop Reliability of Wafer Level Packaging with Redistribution Structure

Ru Mao,Zhai Xinduo,Bai Lin,Chen Dong,Guo Hongyan,Li Yuesheng,Xiao Fei
DOI: https://doi.org/10.3969/j.issn.1003-353x.2013.09.012
2013-01-01
Abstract:Wafer level packaging(WLP) with redistribution layers(RDL) could realize high density packaging and cost reduction by relocating the pads over the active area layer and integrating passive components.Wafer level packages are widely applied in portable devices,and during loading,transportation and practical using,the wafer shock resistance have attracted much attention.Board level drop test was conducted on WLP with RDL according to the JEDEC standard.firstly,The reliability of the components assembled at different positions on PCB was analyzed.Then the influences of the RDL structure,pitch size and solder ball size on the reliability of RDL structure WLP devices were studied.Finally,the failed samples were analyzed by the cross-section observation using the digital optical microscopy.Based on the three dimensional finite element model and failure analysis results,the failure mechanism of the RDL and copper pillar structured WLPs caused by drop shock were explained.
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