Abstract:Surfaces of metal oxides are of crucial importance for a variety of technological applications such as heterogeneous catalysis, thin film growth, gas sensing, and corrosion prevention [1]. Due to the complexities of oxides in crystal structure and electronic structure, however, the surface science of oxides lags far behind that of metals or semiconductors. Conventional surface-science techniques, typically scanning tunneling microscopy (STM) and low energy electron diffraction (LEED), are usually limited to surfaces of single crystals with relatively simple structures. Metal oxides are usually good insulators, either band insulators or Mott insulators, making them not suitable for STM, LEED, and most of spectroscopic methods using low energy electrons as probes. On the other hand, the complex atomic structures of oxides results in too many structural parameters to be determined by spectroscopy or diffraction methods. Recent developments in high-resolution transmission electron microscopy (TEM) provide us opportunities to overcome the above difficulties. With the realization of aberration-correction, the point resolution of TEM has been improved into the milestone 1 Angstrom scale. In addition, the correction of the spherical aberration has almost eliminated the contrast delocalization in high-resolution images. Therefore, high resolution TEM becomes an even more powerful tool than before for materials research at a truly atomic-scale. Here, we will present our recent works on atomic and electronic structure of oxide surfaces [2-3]. We will show that the structure and dynamics of oxide surfaces can be directly imaged and measured at the sub-angstrom scale with an accuracy of picometers, comparable to that obtained by conventional surface science techniques on single crystals.

Imaging of Polar Surfaces: Atomic Resolution with A Charged Tip

True Atomic-Resolution Imaging under Ambient Conditions via Conductive Atomic Force Microscopy

Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations

A Novel Atomic Force Microscope with High Stability and Scan Speed

True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy

Submolecular-resolution non-invasive imaging of interfacial water with atomic force microscopy

Imaging Simulation of Charged Nanowires in TEM with Large Defocus Distance.

Weakly Perturbative Imaging of Interfacial Water with Submolecular Resolution by Atomic Force Microscopy

Research Progress in Atomic Resolution Microscopy

Atomic observation on diamond (001) surfaces with non-contact atomic force microscopy

Atomic Mechanism of Polarization-Controlled Surface Reconstruction in Ferroelectric Thin Films.

The mechanism of high-resolution STM/AFM imaging with functionalized tips

Double Tips for In-Plane Polarized Near-Field Microscopy and Spectroscopy

Direct Atomic Imaging of Oxide Surfaces

Mapping Surfaces Using Regionally Specific Hyperfine Polarization

CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces

Pulsed-Laser Atom-Probe and Field-Ion Microscope Study of Solid-Surfaces

A simple method for AFM tip characterization by polystyrene spheres.

Local Crystallography Analysis for Atomically Resolved Scanning Tunneling Microscopy Images

Direct Observation of Atomic Step‐Assisted Stabilization of Polar Surface

Polar Inelastic Profiles in Fast-Atom Diffraction at Surfaces