Abstract:Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7x7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.

What problem does this paper attempt to address?

The key problem that this paper attempts to solve is how to observe and understand the atomic orbitals on the Si(111)-(7×7) surface through Atomic Force Microscopy (AFM) imaging technology. Specifically, the research aims to: 1. **Improve AFM resolution**: By optimizing parameters such as the stiffness and amplitude of the cantilever, reduce noise and achieve an unprecedentedly high resolution, so that the non - hemispherical appearance of a single atom can be observed. These deviations are related to the symmetry of chemical bonds. 2. **Explore the atomic structure of the Si(111)-(7×7) surface**: Use the known Si(111)-(7×7) surface structure as a standard sample and deduce the structure of the probe tip through AFM images because there is little information about the structure and composition of the probe tip. 3. **Explain the physical meaning of AFM images**: By simulating different tip - sample interaction forces (such as chemical bonds, van der Waals forces and electrostatic interactions), explain the features of AFM images obtained in the experiment and explore how to observe atomic orbitals through AFM. ### Main research contents 1. **Experimental devices and methods**: - An improved commercial Scanning Tunneling Microscope (STM) was used, equipped with a force sensor (qPlus sensor) based on a quartz tuning - fork. - Imaging was carried out through the Frequency - Modulation AFM (FM - AFM) mode. In this mode, the frequency of the cantilever changes when it approaches the sample, and this change is used to generate images. 2. **Theoretical models and simulations**: - The forces between the tip and the sample were calculated, including long - range forces (such as van der Waals forces and electrostatic interactions) and short - range forces (such as chemical bonding). - The Stillinger - Weber potential energy model was used to describe the chemical interactions in silicon materials. - The frequency shifts at different amplitudes were simulated and their influence on the images was analyzed. 3. **Experimental results**: - The experimental results show that each adatom presents two peaks in the AFM image, which is attributed to the fact that two dangling bonds of the tip image a single dangling bond of the adatom. - The view that the tungsten tip may be attached with silicon crystals or clusters at the end was put forward, which explains why high - quality images can also be obtained using tungsten tips. ### Conclusion This research shows that the resolution can be significantly improved by optimizing AFM operating parameters, making it possible to observe atomic details that were previously undetectable. In addition, by using the known Si(111)-(7×7) surface structure as a reference, researchers can deduce the structure of the probe tip, further verifying the ability of AFM to image at the nanoscale. Finally, this work provides an important experimental and theoretical basis for a more in - depth understanding of atomic orbitals and surface chemistry in the future.

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