An Isotopic Labeling Study of the Diffusion Mechanism During Oxidation of Si(100) in Water Vapor by Successive Oxidation

C. Zhong,Y. M. Jiang,J. Gong,B. Deng,J. Li
DOI: https://doi.org/10.1007/s00339-009-5286-z
2009-01-01
Abstract:The diffusion mechanism during the wet oxidation of Si(100) at 1373 K was investigated by successive oxidations finally containing isotopic water. SiO 2 was first thermally grown on Si in non-labeled oxidizing ambient (dry O 2 or H 2 O) followed by isotopic water (H 2 18 O) to trace 18 O species in SiO 2 . The distributions of 16 O and 18 O in the oxide film were analyzed by means of secondary ion mass spectroscopy (SIMS). SIMS depth profiles show that there was a wide overlap of both isotopes ( 18 O and 16 O) throughout the SiO 2 layer, no matter whether the first oxidation step was carried out in dry O 2 or H 2 O, and the concentration gradient of 18 O decreased with increasing oxidation time at the second oxidation step by H 2 18 O. The results suggest that the diffusion mechanism in SiO 2 during water vapor oxidation is exchange diffusion; H 2 O related oxidizing species diffuse through the network with significant exchange with the pre-existing oxygen in it.
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