Multifractal behavior of solid-on-solid growth

Wang Bing,Wang Yan,Wu Ziqin
DOI: https://doi.org/10.1016/0038-1098(95)00383-5
IF: 1.934
1995-01-01
Solid State Communications
Abstract:The multifractal behavior of solid-on-solid growth on a 2 dimensional substrate has been studied. The results show that the deposition process can be characterized by a multifractal approach and the widths Delta alpha and the heights alpha f of singularity spectra f(alpha) are related to the average film thickness h (proportional to the deposition time) as Delta alpha similar to h(gamma 1) and Delta f similar to h(gamma 2), where gamma(1) = -0.92 +/- 0.03 and gamma(2) = -0.87 +/- 0.03.
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