A reflection mode SNOM based on piezoelectric bimorph

CAI Wei,XU Ping,QIAN Jian-qiang,LI Yuan,YAO Jun-en
DOI: https://doi.org/10.3969/j.issn.1000-6281.2006.04.003
2006-01-01
Abstract:A SNOM operating in reflection mode was described in this article.A kind of piezoelectric bimorph was used in this system as the key component for tip-sample distance regulation.The optical fiber probe oscillates parallel to the sample surface by driving the bimorph with the probe at its first modal resonance.The RMS detecting circuit was used to measure the amplitude of the oscillating signal.The distance between the optical fiber probe and the sample can be regulated in the near-field of the sample surface.The fine shear force topographic images and the near-field optical images of the calibration grating and the film of CD-R disk have been obtained.
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