The Application of Atomic Force Microscopy in Mineral Flotation
Yaowen Xing,Mengdi Xu,Xiahui Gui,Yijun Cao,Bent Babel,Martin Rudolph,Stefan Weber,Michael Kappl,Hans-Juergen Butt
DOI: https://doi.org/10.1016/j.cis.2018.01.004
IF: 15.19
2018-01-01
Advances in Colloid and Interface Science
Abstract:During the past years, atomic force microscopy (AFM) has matured to an indispensable tool to characterize nanomaterials in colloid and interface science. For imaging, a sharp probe mounted near to the end of a cantilever scans over the sample surface providing a high resolution three-dimensional topographic image. In addition, the AFM tip can be used as a force sensor to detect local properties like adhesion, stiffness, charge etc. After the invention of the colloidal probe technique it has also become a major method to measure surface forces. In this review, we highlight the advances in the application of AFM in the field of mineral flotation, such as mineral morphology imaging, water at mineral surface, reagent adsorption, inter-particle force, and bubble-particle interaction. In the coming years, the complementary characterization of chemical composition such as using infrared spectroscopy and Raman spectroscopy for AFM topography imaging and the synchronous measurement of the force and distance involving deformable bubble as a force sensor will further assist the fundamental understanding of flotation mechanism.