Dependence of reaction pressure on deposition and properties of boron-doped freestanding diamond films

Liuan Li,Hongdong Li,Xianyi Lü,Shaoheng Cheng,Qiliang Wang,Shiyuan Ren,Junwei Liu,Guangtian Zou
DOI: https://doi.org/10.1016/j.apsusc.2009.09.109
IF: 6.7
2010-01-01
Applied Surface Science
Abstract:In this paper, we investigate the reaction pressure-dependent growth and properties of boron-doped freestanding diamond films, synthesized by hot filament chemical vapor deposition (HFCVD) at different boron-doping levels. With the decrease in pressure, the growth feature of the films varies from mixed [111] and [110] to dominated [111] texture. The low reaction pressure, as well as high boron-doping level, results in the increase (decrease) of carrier concentration (resistivity). The high concentration of atomic hydrogen in the ambient and preferable [111] growth, due to the low reaction pressure, is available for the enhancement of boron doping. The estimated residual stress increases with increase in the introducing boron level.
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