Effect of GaAs/GaSb Combination Strain-Reducing Layer on Self-Assembled InAs Quantum Dots

Jiang Zhong-Wei,Wang Wen-Xin,Gao Han-Chao,Li Hui,Yang Cheng-Liang,He Tao,Wu Dian-Zhong,Chen Hong,Zhou Jun-Ming
DOI: https://doi.org/10.7498/aps.58.471
IF: 0.906
2009-01-01
Acta Physica Sinica
Abstract:Optical properties and surface structures of InAs/GaAs serf-assembled QDs grown on 2 ML GaSb and x-ML GaAs combined strain-buffer layer are investigated systematically by photoluminescence (PL) and atomic force microscopy (AFM). The QD density varies from 1.2 x 10 cm(-2) to 8.0 x 10 cm(-2) due to the influence of the lattice mismatch. The combined layer favors the increasing of In incorporated into dots and the average height-to-width ratio, which resulted in the red-shift of the emission peaks. For the sample of 5 ML GaAs thin film the ground state transition is shifted to nearly 1300 nm at room temperature.
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