A simple method of calculating the capacitance of an insulated conductor

Xingling Zhou,Weigan Lin

DOI: https://doi.org/10.1002/mop.4650060607

IF: 1.311

1993-01-01

Microwave and Optical Technology Letters

Abstract:This article will employ very simple mathematics to calculate the capacitance of an insulated conductor of arbitrary shape. Simple but accurate enough formulas are found. As examples, three cases are given in this article.

What problem does this paper attempt to address?

A Simplified Approach for Calculating the Capacitance of Single Conductor by Solving the Electrostatic Field

Yunqi ShangGuan,Jiansheng Yuan,Jun Zou

DOI: https://doi.org/10.1109/isemc.2016.7571613

2016-01-01

Abstract:The capacitance between two terminals of a single conductor working with time-dependent signals is defined by the amount of energy stored in the electric field outside the conductor. A simple approach for calculating the capacitance is presented in this paper, which only needs the computation of an electrostatic field. The approach is derived based on two assumptions, (1) the distribution of potentials on the conductor surface is almost the same, created by a time-dependent current and a direct current flowing in the conductor, (2) the distribution of the potential created by a direct current in the conductor can be modeled by an electrostatic field, in which the conductor is replaced by a dielectric with high permittivity. The approach is only suitable for low-frequency situations, where the displacement current and the inductive electric field can be disregarded.
Calculation of Single Conductor Capacitance by Estimating the Electrostatic Field

Yong Chen,Jiansheng Yuan

DOI: https://doi.org/10.4028/www.scientific.net/amr.542-543.1242

2012-01-01

Abstract:The capacitance between two terminals of a single conductor working with time-dependent signals is defined by the amount of energy stored in the electric field outside the conductor. A simple approach for calculating the capacitance is presented in this paper, which only needs the computation of an electrostatic field. The approach is derived based on two assumptions, (1) the distribution of potentials on the conductor surface is almost the same, created by a time-dependent current and a direct current flowing in the conductor, (2) the distribution of the potential created by a direct current in the conductor can be modeled by an electrostatic field, in which the conductor is replaced by a dielectric with high permittivity. The approach is only suitable for low-frequency situations, where the displacement current and the inductive electric field can be disregarded.
Floating Random Walk-Based Capacitance Simulation Considering General Floating Metals.

Wenjian Yu,Zhezhao Xu,Bo Li,Cheng Zhuo

DOI: https://doi.org/10.1109/tcad.2017.2782770

IF: 2.9

2018-01-01

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Abstract:Accurate capacitance calculation for structures including floating metals is of great interest to both the modeling of interconnect wires and the verification of on-chip capacitors in the design of integrated circuit. The former problem involves regular-shape or cuboid floating dummy fills, and has been addressed with an existing fast algorithm based on floating random walk (FRW) method. The latter problem involves floating metals in more general and complex shape, and is crucial for the design of high-density metal–insulator–metal (MIM) capacitor which endures higher voltage. How to efficiently handle these general-shape floating metals becomes a challenge. In this paper, we first investigate the mechanism of the existing FRW-based approach for handling floating dummies, and then propose an approach based on the central difference formula for handling the general-shape floating metals. The proposed approach has comparable cost to the existing work, but is much more reliable and accurate. Experiments on the structures with floating dummies and MIM capacitor structures have validated the effectiveness and advantage of the proposed approach.
Analysis of Conductor Loss in Interdigital Capacitor Based Measurement of Dielectric Constant of Ferroelectric Thin Film

P. Wang,C. Y. Tan,Y. G. Ma,W. N. Cheng,C. K. Ong

DOI: https://doi.org/10.1002/mop.23141

IF: 1.311

2008-01-01

Microwave and Optical Technology Letters

Abstract:A procedure to include conductor loss in interdigital capacitor based dielectric constant measurements is proposed. The effect of conductor loss and contact resistance can be regarded as a series resistor connected to the interdigital capacitor. If the thickness of the conductor film is known, the conductor loss could be calculated and subtracted from the measurement results. In the frequency range where the dielectric constant of the material in test does not change with frequency, the conductor loss could also be obtained by measuring the frequency dependence of the impedance of the interdigital capacitor. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 566–568, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23141
Icing Thickness Measuring Method with a Capacitance Sensor for Overhead Power Transmission Lines

张思建,林志赟,颜钢锋

2011-01-01

Abstract:A novel icing thickness monitoring method for overhead power transmission line is proposed and an icing monitoring capacitance sensor is designed.A design scheme of power transmission line icing thickness monitoring system with a capacitance sensor is presented.The relationship curve between capacitance value of the sensor and ice thickness of transmission lines is calculated based on capacitive effect.Then in practical applications,the icing thickness is obtained by comparison between the capacitance values and the preset relationship curves.The effectiveness of the proposed icing thickness monitoring method is verified by testing results.
Analytical Formulas for the Barrel-Plate and Pad-Plate Capacitance in the Physics-Based Via Circuit Model for Signal Integrity Analysis of PCBs

Yaojiang Zhang,Erping Li,Zawzaw Oo,Wenzu Zhang,Enxiao Liu,Xinchang Wei,Jun Fan

DOI: https://doi.org/10.1109/apmc.2009.5385476

2009-01-01

Abstract:The current distribution along via barrel and pad is obtained by the Green's function of a generalized coaxial cavity for a magnetic frill current. An analytical formula for both the barrel-plate and pad-plate capacitances are derived by observing the current difference along the via barrel and pad. Finite difference method has been used to validate the formula derived here. Analytical formula presented facilitates the implementation of the physics-based via circuit model in practical via designs for printed circuit boards and packages. The impact of various via geometric parameters on the parasitic capacitances has been investigated.
Capacitance Extraction of Three-Dimensional Interconnects Using Element-By-Element Finite Element Method (Ebe-Fem) and Preconditioned Conjugate Gradient (pcg) Technique

Jianfeng Xu,Hong Li,Wen-Yan Yin,Junfa Mao,Le-Wei Li

DOI: https://doi.org/10.1093/ietele/e90-c.1.179

2007-01-01

IEICE Transactions on Electronics

Abstract:The element-by-element finite element method (EBE-FEM) combined with the preconditioned conjugate gradient (PCG) technique is employed in this paper to calculate the coupling capacitances of multi-level high-density three-dimensional interconnects (3DIs). All capacitive coupling 3DIs can be captured, with the effects of all geometric and physical parameters taken into account. It is numerically demonstrated that with this hybrid method in the extraction of capacitances, an effective and accurate convergent solution to the Laplace equation can be obtained, with less memory and CPU time required, as compared to the results obtained by using the commercial FEM software of either MAXWELL 3D or ANSYS.
New C4D Sensor with a Simulated Inductor

Yingchao Lyu,Haifeng Ji,Shijie Yang,Zhiyao Huang,Baoliang Wang,Haiqing Li

DOI: https://doi.org/10.3390/s16020165

2016-01-01

Abstract:A new capacitively coupled contactless conductivity detection (C 4 D) sensor with an improved simulated inductor is developed in this work.The improved simulated inductor is designed on the basis of the Riordan-type floating simulated inductor.With the improved simulated inductor, the negative influence of the coupling capacitances is overcome and the conductivity measurement is implemented by the series resonance principle.The conductivity measurement experiments are carried out in three pipes with different inner diameters of 3.0 mm, 4.6 mm and 6.4 mm, respectively.The experimental results show that the designs of the new C 4 D sensor and the improved simulated inductor are successful.The maximum relative error of the conductivity measurement is less than 5%.Compared with the C 4 D sensors using practical inductors, the measurement accuracy of the new C 4 D sensor is comparable.The research results also indicate that the adjustability of a simulated inductor can reduce the requirement for the AC source and guarantee the interchangeableness.Meanwhile, it is recommended that making the potential of one terminal of a simulated inductor stable is beneficial to the running stability.Furthermore, this work indirectly verifies the possibility and feasibility of the miniaturization of the C 4 D sensor by using the simulated inductor technique and lays a good foundation for future research work.
Determination of the Capacitance, Inductance, and Characteristic Impedance of Rectangular Lines

T.-S. Chen

DOI: https://doi.org/10.1109/tmtt.1960.1124779

IF: 4.3

1960-09-01

IEEE Transactions on Microwave Theory and Techniques

Abstract:This paper determines the capacitance, inductance, and characteristic impedance of rectangular lines by the method of conformal transformation. In practical applications, such lines may be used as transmission links of RF energy, as impedance-transforming sections, or as components in electron tubes. Formulas are given for the calculation of the parameters of rectangular lines having the following characteristics: 1) The inner conductor may have varying thickness compared with the depth of the outer conductor. 2) The axes of the conductors may coincide or may be displaced with respect to each other. 3) The edges of the inner conductor may be rounded to lessen the electrical stress occurring at sharp corners. Excellent agreement has been obtained between the calculated results and those found by use of the relaxation method, by direct measurement of models, and by electrolytic tank measurement.

engineering, electrical & electronic
An Improved Fast Method for Computing Capacitance

L Song,A Konrad

DOI: https://doi.org/10.1108/03321640410540674

2004-01-01

Abstract:In the design of chip carriers, appropriate analysis tools can shorten the overall production cycle and reduce costs. Among the functions to be performed by such computer‐aided engineering software tools are self and mutual capacitance calculations. Since the method of moments is slow when applied to large multi‐conductors systems, a fast approximate method, the average potential method (APM), can be employed for capacitance calculations. This paper describes the improved average potential method, which can further reduce the computational complexity and achieve more accuracy than the APM.
A Charge Mapping Method for the Capacitance of Conducting Plate

Xiaobo Liu,Zhaoxian Zeng,Jingsi Zhang,Rui Lu,Wei Li,Xiaoli Dong,Anxue Zhang

DOI: https://doi.org/10.1109/lmwc.2017.2691064

IF: 3

2017-01-01

IEEE Microwave and Wireless Components Letters

Abstract:In this letter, a charge mapping method (CMM) is proposed to solve for the charge distribution and capacitance of conducting plate. Based on two examples, it is speculated that linear transformation plays a more important role than the mapping of boundary curves in the charge mapping between two conducting plates. The capacitances for rectangles and parallelogram conducting plates are simulated to validate the proposed CMM. Compared with the method of moments (MoM), the CMM exhibits same level of precision with a relative error of 2%, but takes less time as the linear transformation scale is increased. This is due to a reduction in the dimension of calculated matrix equation. When the linear transformation scale is 450, computation time using the CMM is only about 1/3rd of that required by MoM.
Finite Element Analysis of Capacitance Sensor

G. Lin,M. Shang,Wen Guang Zhang,Fei Zhou

DOI: https://doi.org/10.4028/www.scientific.net/AMM.599-601.940

2014-08-01

Abstract:Capacitive sensor is a kind of parameter type sensor that capacitance is measured is converted to capacitance change. It is widely used in pressure, liquid level, displacement and other tests. In this article, the development status of capacitance sensor is showed; the working principle of capacitive sensor was introduced; through the method of grid subdivision, loading and solving of boundary conditions and the finite element post-processing, etc., the finite element analysis of capacitance sensor is complete, it has important guiding significance for capacitance sensor application research.

Materials Science,Engineering
An Analytical Model of the Detecting Structure of Electrostatic Inductive Electric Field Sensor

Shiping Chen,Zhanqing Yu,Ya Mou,Haonan Fang

DOI: https://doi.org/10.1016/j.measurement.2023.113618

IF: 5.6

2023-01-01

Measurement

Abstract:To analyze and design the detecting structure of electrostatic inductive electric field sensors, it is crucial to determine the capacitance. This study proposes a model for the theoretical analysis of the capacitance of the detecting structure of the electrostatic inductive electric field sensor. The aim is to achieve high calculation accuracy and deepen the fundamental understanding of high performance. Using Schwarz-Christoffel mapping, a reasonably simplified and approximative solution program is developed. The precision is comparable to that of a finite element solver. The calculation results exhibit good agreement with the simulation results from finite element analysis when various parameter ratios are used. Notably, the calculation results of the analytical model are verified by the measured data of a realistic electrostatic sensor. Using the analytical model, a parametric study of the detecting structure is conducted, leading to the determination of the final optimized, technically achievable device structures.
AN IMPROVED SURFACE CHARGE SIMULATION METHOD AND ITS APPLICATION TO COMPUTATION OF THREE-DIMENSIONAL CAPACITANCE

赵中原,邱毓昌,方志,于永明,王建生

DOI: https://doi.org/10.3321/j.issn:0258-8013.2002.06.015

2002-01-01

Abstract:This paper presents an improved surface charge simulation for computation of three-dimensional capacitance. In this method, each curved surface on which the charge is distributed is divided into a number of curved surface elements instead of planar elements. The surface shape of each element is approximated by a quadratic formula. The capacitance of a shielding ring and a plane against ground is calculated using this improved surface charge simulation method. The computed capacitance values of these configurations agree well with the measured data.
Analysis of approaches for modeling the contact resistance on conductor interface by the finite element method

Zejun Shen,Li Hao,Peng Zuo,Jiansheng Yuan

2013-01-01

Abstract:There may be an additional contact resistance on the interface of conductor regions caused by the change of material property, i.e., the resistivity. The simulation of the contact re- sistance is very important to get the Joule-heat losses of the conductors. However, it is difficult or impossible to model and calculate the contact resistance by using the traditional finite element method (FEM). A new method to model the contact resistance has been proposed in this article, with the help of the contact element in FEM software ANSYS. The contact element meshes the interface between conductors directly. With the parameter of "surface conductivity", equations can be set up to couple the value elements of the conductors. We have implemented the simula- tion of contact resistance on the interface of different shape regions. Some examples of contact resistance calculation under different contact conditions are given and compared to those given by other methods. It is shown that using the contact element of ANSYS can model the contact resistance more easily and accurately, with a great advantage over other methods. Copyright © 2013 The Electromagnetics Academy.
Estimating Method of Resistance of An L-shaped Thin Conductor

HAN Jin-chi,ZOU Jun

DOI: https://doi.org/10.3969/j.issn.1008-0686.2012.05.035

2012-01-01

Abstract:In this paper,the method of using arc conductor as an equivalent to estimate corner resistance of irregular shaped conductor is discussed.Starting from studying the estimation of L-shaped thin conductor resistance with constant width,this paper has further extended the method to estimate resistance with variable width.Basing error analysis with the certain method to estimate,an approach of improving the accuracy of estimation by dividing the area to be solved is provided,and several numerical examples are involved to compare the accuracy between estimation with different extent of division.
Nondestructive method of thin film dielectric constant measurements by two-wire capacitor

Svitlana Kondovych,Igor Luk'yanchuk

DOI: https://doi.org/10.1002/pssb.201600476

2016-11-27

Abstract:We suggest the nondestructive method for determination of the dielectric constant of substrate-deposited thin films by capacitance measurement with two parallel wires placed on top of the film. The exact analytical formula for the capacitance of such system is derived. The functional dependence of the capacitance on dielectric constants of the film, substrate, and environment media and on the distance between the wires permits to measure the dielectric constant of thin films for the vast set of parameters where previously proposed approximate methods are less efficient.

Mesoscale and Nanoscale Physics
A finite‐difference‐based technique for numerically efficient computation of capacitance matrices for 2‐dimensional multi‐conductor problems involving thin dielectric coating

Kapil Sharma,Raj Mittra

DOI: https://doi.org/10.1002/jnm.3261

2024-06-26

Abstract:Abstract Numerical computation of capacitance matrices using conventional finite‐difference (FD) technique for arbitrarily shaped multi‐conductor problems which typically involve thin dielectric coating is challenging due to the fact that an extremely fine discretization of the computational domain is required to capture the nuances of the geometries involved, which, in turn, exacts a high computational resource cost—both in terms of memory and time. In this paper, we present a novel finite‐difference‐based technique which utilizes polynomial interpolation and extrapolation techniques in conjunction with the conventional finite‐difference technique to handle 2‐dimensional problems involving multiple conductors, typically with a thin dielectric coating. The proposed technique does not require fine discretization of the computational domain and provides accurate results in an efficient manner.

engineering, electrical & electronic,mathematics, interdisciplinary applications
Distributed capacitance and inductance of transmission lines by considering the effects from ends and bends

ye chunfei,li erping

DOI: https://doi.org/10.1109/ELMAGC.2002.1177373

2002-01-01

Abstract:A transmission line of finite length conductor with bend is considered. Explicit expressions for the per-unit-length parameters of the line are derived by using non-uniform transmission line approach and are verified by the method of moment.
Estimation Method of Resistance Based on Model of Axisymmetric Quadrilateral Thin Conductor

Peng XUE,Xin ZAN,Jun ZOU

DOI: https://doi.org/10.3969/j.issn.1008-0686.2016.01.013

2016-01-01

Abstract:In this paper,a method of using axisymmetric thin conductor model as an equivalent to estimate corner resistance of an irregular shaped conductor is discussed. Starting from theoretical analysis,this paper demonstrates thatresistances between the opposite sides of all kinds of quadrilateral thin conductors are equal to their square re-sistances. Based on this conclusion,an estimation of resistance of a thin conductor which utilizes the approximate division is proposed. For instance,the method can be used to estimate resistance of an L-shaped thin conductor, and the effectiveness and accuracy of the method is analyzed and discussed when estimating.

A simple method of calculating the capacitance of an insulated conductor

A Simplified Approach for Calculating the Capacitance of Single Conductor by Solving the Electrostatic Field

Calculation of Single Conductor Capacitance by Estimating the Electrostatic Field

Floating Random Walk-Based Capacitance Simulation Considering General Floating Metals.

Analysis of Conductor Loss in Interdigital Capacitor Based Measurement of Dielectric Constant of Ferroelectric Thin Film

Icing Thickness Measuring Method with a Capacitance Sensor for Overhead Power Transmission Lines

Analytical Formulas for the Barrel-Plate and Pad-Plate Capacitance in the Physics-Based Via Circuit Model for Signal Integrity Analysis of PCBs

Capacitance Extraction of Three-Dimensional Interconnects Using Element-By-Element Finite Element Method (Ebe-Fem) and Preconditioned Conjugate Gradient (pcg) Technique

New C4D Sensor with a Simulated Inductor

Determination of the Capacitance, Inductance, and Characteristic Impedance of Rectangular Lines

An Improved Fast Method for Computing Capacitance

A Charge Mapping Method for the Capacitance of Conducting Plate

Finite Element Analysis of Capacitance Sensor

An Analytical Model of the Detecting Structure of Electrostatic Inductive Electric Field Sensor

AN IMPROVED SURFACE CHARGE SIMULATION METHOD AND ITS APPLICATION TO COMPUTATION OF THREE-DIMENSIONAL CAPACITANCE

Analysis of approaches for modeling the contact resistance on conductor interface by the finite element method

Estimating Method of Resistance of An L-shaped Thin Conductor

Nondestructive method of thin film dielectric constant measurements by two-wire capacitor

A finite‐difference‐based technique for numerically efficient computation of capacitance matrices for 2‐dimensional multi‐conductor problems involving thin dielectric coating

Distributed capacitance and inductance of transmission lines by considering the effects from ends and bends

Estimation Method of Resistance Based on Model of Axisymmetric Quadrilateral Thin Conductor