Mechanisms of femtosecond laser-induced breakdown and damage in MgO

S.Z. Xu,T.Q. Jia,H.Y. Sun,C.B. Li,X.X. Li,D.H. Feng,J.R. Qiu,Z.Z. Xu
DOI: https://doi.org/10.1016/j.optcom.2005.08.059
IF: 2.4
2006-01-01
Optics Communications
Abstract:Single-shot laser damage threshold of MgO for 40–986fs, 800nm laser pulses is reported. The pump–probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold.
What problem does this paper attempt to address?