Ultrafast dynamics in ZnO thin films irradiated by femtosecond lasers

Chengbin Li,Donghai Feng,Tianqing Jia,Haiyi Sun,Xiaoxi Li,Shizhen Xu,Xiaofeng Wang,Zhizhan Xu
DOI: https://doi.org/10.1016/j.ssc.2005.09.003
IF: 1.934
2005-01-01
Solid State Communications
Abstract:The damage morphologies, threshold fluences in ZnO films were studied with femtosecond laser pulses. Time-resolved reflectivity and transmissivity have been measured by the pump-probe technique at different pump fluences and wavelengths. The results indicate that two-phase transition is the dominant damage mechanism, which is similar to that in narrow band gap semiconductors. The estimated energy loss rate of conduction electrons is 1.5eV/ps.
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