MicroCT Characterization on Microstructure of C/SiC Composites

FENG Yan-jian,FENG Zu-de,LI Si-wei,ZHANG Wei-hua,LUAN Xin-gang,LIU Yong-sheng,CHENG Lai-fei
DOI: https://doi.org/10.3969/j.issn.1005-5053.2011.2.010
2011-01-01
Abstract:Nondestructive three-dimensional structure of 3D C/SiC composites fabricated by chemical vapor infiltration(CVI) was characterized using X-ray microcomputed tomography(MicroCT).The current study was undertaken to assess the capabilities and limitations of MicroCT for the characterization of C/SiC composites.Results demonstrate that MicroCT can facilitate characterization of fabric morphology,defects(porosity and the different densities of SiC matrix) in 3D C/SiC composites.A gas retention and viscous flow formation in the preform was revealed in the light of three-dimensional porosity.A nodular surface morphology of SiC matrix fabricated by CVI was observed by reconstructing the matrix porosity-wall.Comparing with the SEM surface morphology of SiC coating fabricated by chemical vapor deposition(CVD),pressure difference between the inner and outer preform was demonstrated.
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