Influence of Shunt Reactors on Model Recognition Pilot Protection

YANG Cheng,SUONAN Jiale
DOI: https://doi.org/10.3969/j.issn.1006-6047.2011.03.005
2011-01-01
Abstract:The features of internal and external faults of the transmission line with shunt reactors at two terminals are analyzed and it is indicated that,the internal fault is equal to the inductor model while the external fault is not equal to the capacitor model.The fault model including the parameters of shunt reactors is established,which is accurately equal to external fault in principle,but hardly applied to current real devices.Further theoretic analysis indicates that,when the capacitor model is equivalent to the external fault of transmission line with shunt reactors,the model error is induced by the high-frequency components of voltage.The higher the frequency is or the bigger the energy is,the larger the model error is.A model recognition protection criterion with high reliability factor based on original inductor and capacitor models is introduced to effectively lower the error.Results of ATP simulations demonstrate that,the sensitivity of introduced criterion is high enough to trip within 15 ms for different internal faults.
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