Dynamic Stress Measurement System of MEMS Based on Raman Spectroscopy

Lina Zheng,Chenyang Xue,Wendong Zhang,Zhang Binzhen,Shengbo Sang
2006-01-01
Abstract:The transient characteristics of the dynamic stress of MEMS(Micro Electro Mechanical System)decides that it is hard to be measured directly by using the traditional stress measurement system.A new kind of dynamic stress measurement system of MEMS was revealed,which was based on Raman spectroscopy and high-frequency modulation principle,it was an integrated MEMS meas- urement system of light,mechanism,electricity.And using this system,the dynamic stress of a cer- tain point at the root of micro-resonator was measured,and the measurement results are matched with ones from the theoretical analysis.Experimental resalts indicate that this system has the charac- teristics of high accuracy,untouched and non destructivity,which is satisfied with the needs of dy- namic stress measurement of MEMS perfectly.
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