Abstract:A method is presented for calculating the reference intensity ratio of crystalline phases with unknown atomic arrangements using just the composition and lattice parameters.The reference intensity ratio (RIR) is the intensity ratio of a specified peak of the target crystalline phase to a certain peak of the reference phase in the powder X‐ray diffraction pattern of a mixture of the target and reference phases in a weight ratio of 1:1. The RIR represents the diffraction power of the target phase compared with that of the reference phase. A quantitative phase analysis (QPA) can be readily made on the basis of only a powder pattern when the RIR values of all component phases in the mixture are available. The RIR of a target phase can be measured experimentally or calculated in accordance with its crystal structure. RIR values are given in most powder diffraction files (PDFs) published by the International Centre for Diffraction Data, but there are still more than 110 000 PDFs for which the RIR is absent. Newly discovered phases may be present in a mixture as components of unknown weight fractions, for which the RIR values can be neither measured nor calculated with the currently available method. Herein is presented a new method of calculating the RIR of a crystalline phase from its lattice parameters, the chemical content of the unit cell and a list of normalized intensities of reflections over a sufficiently large diffraction angle range. The new method can be used to calculate not only the absent RIRs in the PDFs but also the RIR of a component phase of a mixture of unknown weight fraction when the lattice parameters and chemical content of the unit cell of the corresponding phase are known.

The Modified of the X-Ray Diffraction Intensity Formula

Computer Simulation Of X-Ray Powder Diffraction Pattern

The diffraction power of crystals with unknown atomic structures: calculation and application in quantitative phase analysis

A Modification on Brook Formula in Calculating the Misfit of Ni-based Superalloys

Direct Method of Determining the Lattice Parameters of a Phase from X-ray Diffraction Pattern of Multi-Phase

The Physical Meanings of 5 Basic Parameters for an X-ray Diffraction Peak and Their Application

Theory of X-ray Diffraction in Crystals--the Legacy of Laue and Ewald

Quasi-universality and scaling behaviour of three-wave X-ray interference in crystals: A novel way for the quantitative determination of X-ray reflection phases

Study on the Effect of X-Ray Diffractometer Inherent Angle Scale Error on the Precision of Lattice Parameter Calculation

X-Ray Multiple Diffraction and the Invariant Phases of Structure Factors

X-ray diffraction performance of thermally distorted crystals

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction

Calculating the reference intensity ratio of crystalline phases with unknown atomic arrangements using the lattice parameters and chemical information

Quantitative Analysis of a Textured Coating by a New X-Ray Diffraction Method

A thermodynamic and analytical description on the quantitative phase-field model with enhanced interface diffusivity

Elements of X-Ray Physics and Crystallography

Comments on A new method for quantitative phase analysis using X-ray powder diffraction: direct derivation of weight fractions from observed integrated intensities and chemical compositions of individual phases by Toraya (2016)

A comparison of X-ray stress measurement methods \\based on the fundamental equation

Combination Method For The Calculation Of Elastic Constants

Kinematical Theory of X-Ray Diffraction

XRD Technique in the Research of Thin Film Materials