Design and Realization of Boundary-scan Test Circuit for FPGA's Chip
YU Wei,LAI Jinmei,SUN Chengshou,TONG Jiarong
DOI: https://doi.org/10.3969/j.issn.1000-3428.2007.13.086
2007-01-01
Abstract:【Abstract】The boundary scan circuit (BSC) applied in the FPGA chip focuses on the PCB-level test and can provide JTAG program mode as well as the function test of the chip. Owing to the increasing pads of FPGA chip and the larger number of the corresponding BS cells, the clock skew is going to be the major consideration in circuit design to avoid the error of data-input. Meanwhile, as BS chain contains a large number of BS cells, the effective test speed will be largely reduced during PCB-level test. In order to solve these problems, modification is made for the original structure of BSC. And the new generation of the BSC not only can realize the function of test, programming, but can provide significant immunity to races, thus, effectively guarantee the correct operation of the circuit. With the modified BSC, the boundary scan chain would be reconfigured to any desired length. In this way, it can improve the effective speed of PCB-level test. 【Key words】boundary scan; FPGA; clock skew; PCB-level test