The Structural and Magnetic Properties of Τ-Mnal Films Prepared by Mn/Al Multilayers Deposition Plus Annealing

C. Y. Duan,X. P. Qiu,B. Ma,Z. Z. Zhang,Q. Y. Jin
DOI: https://doi.org/10.1016/j.mseb.2009.04.005
IF: 3.407
2009-01-01
Materials Science and Engineering B
Abstract:The structural and magnetic properties of τ-MnAl alloy films are studied. The films are derived by annealing from Mn/Al multilayers. τ-MnAl appears when the annealing temperature increases up to 350°C, but decomposes into γ2-MnAl and β-Mn at 500°C annealing. Good magnetic properties are obtained after 400–450°C annealing. Furthermore, τ-MnAl forms in the Mn–Al interface. The saturation magnetization MS increases first with the thickness of Mn (or Al) layers, and then decreases in inverse proportion to that of Mn (or Al) layers. The turning point implies that the thickness of τ-MnAl is no more than 5nm in the Mn60Al40 films.
What problem does this paper attempt to address?