A Novel Common and Differential Mode Noise Separation of Conducted EMI

Luo Ping,Li Zhaoji
DOI: https://doi.org/10.13382/j.jemi.2006.01.009
2006-01-01
JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT
Abstract:Typical testing methods of conducted electromagnetic interference (EMI) almost are hybrid test and sepa-rated test at separated time. The conventional measurements are not very precise due to the common mode noise and dif-ferential mode noise are not separated completely or not tested at the same time. Aim at the different causes and produc-ing principles of common mode noise and differential mode noise, a novel CM/DM noise separating network of the conducted EMI is proposed in this paper, which can be used to measure common mode/differential mode noise at the same time. The novel CM/DM noise separating network is based on a simple testing equivalent circuit. The design principle of the testing circuit and the simulation results of the novel CM/DM noise separating network are introduced in this paper. Moreover, the simulation results show the separated measurements are good while adopting the CM/DM noise separating network presented in this paper.
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