Preparation and Electrical Properties of Electrospun Tin-Doped Indium Oxide Nanowires

Dandan Lin,Hui Wu,Rui Zhang,Wei Pan
DOI: https://doi.org/10.1088/0957-4484/18/46/465301
IF: 3.5
2007-01-01
Nanotechnology
Abstract:Well-aligned tin-doped indium (ITO) nanowires have been prepared using the electrospinning process. The Sn doping mechanism and microstructure have been characterized by x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS). Devices for I–V measurement and field-effect transistors (FETs) were assembled using ITO nanowires with top contact configurations. The effect of Sn doping on the electrical conductivity was significant in that it enhanced the conductance by over 107 times, up to ∼1 S cm−1 for ITO nanowires with an Sn content of 17.5 at.%. The nanowire FETs were operated in the depletion mode with an electron mobility of up to 0.45 cm2 V−1 s−1 and an on/off ratio of 103.
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