Studies on Topographical Microstructure of Spirulina Platensis by Atomic Force Microscopy

NIE Ming,ZHANG Wei-qiong,PENG Jun,WEI Xin-lin,XIAO Ming
DOI: https://doi.org/10.3969/j.issn.1004-311x.2005.06.025
2005-01-01
Biotechnology
Abstract:Detection on topographical microstructure of organisms is hotspot in life sciences research in the world.Topographical microstructure of Spirulina platensis by Atomic Force Microscopy(AFM) was studied in this paper.Three clear and steady figures of 5.000×5.000μm,1.000×1.000μand 400.0×400.0nm scanning size were obtained,and linear analysis of them was processed.The results indicated that the surface of Spirulina platensis consists of close-knit and out-of-order protuberances which are 3nm~15nm in height and about 8~9nm in average heigh By using this method for determining of topographical microstructure of organisms,the operation is simple,fast and sensitive with satisfactory results.
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