Application of curved crystal spectrometer in measuring X-ray line

SHI Jun,XIAO Sha-li,Wang Hong-jian,Changhuan Tang,Lei Xiao-ming
DOI: https://doi.org/10.3321/j.issn:1005-0086.2008.09.005
2008-01-01
Abstract:A focusion curved crystal spectrometer has been developed to measure X-ray lines radiated from laser-produced plasmas.Which is based on the theory that the ray emitted from a focus of an ellipse will converge on the other focus by the reflection on the elliptical surface.The focal length and the eccentricity of the ellipse is 1 350 mm and 0.958 6,respectively.The spectrograph can be used to measure the X-ray lines in the wavelength range of 0.2-0.37 nm,and the LiF crystal(200)(2 d=0.402 7 nm)is used as dispersive element covering Bragg angle from 30°-67.5°.The spectrograph was experimented on "Shenguang-Ⅱ" with laser energy of 60-80 J and laser wavelength of 0.35 μm.Photographs of spectra including the 1 s2p1P1-1s21 S0 resonance line(w),the 1s2p3P2-1s21 S0 magnetic quadrupole line(x),the 1s2p3P1-1s21 S0 intercombination lines(y),the 1s2p1P1-1s21 S0 forbidden line(z)in heliumlike TiⅩⅪ and the 1s2s2p2P3/2-1s22s2S1/2 line(q)in lithiumlike TiⅩⅩ have been recorded with X-ray CCD camera.The experimental result shows that the wavelength resolution(λ/Δλ)is above 1000 and the elliptical crystal spectrometer is suitable to diagnose X-ray spectroscopy.
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