Analytic Investigation on the Threshold Voltage of Fully-Depleted Surrounding-Gate Metal-Oxide-Semiconductor Field-Effect Transistors

Guang-Xi Hu,Ran Liu,Ting-Ao Tang,Ling-Li Wang
DOI: https://doi.org/10.3938/jkps.52.1909
2008-01-01
Journal of the Korean Physical Society
Abstract:Analytic solutions for the surrounding-gate (SG) metal-oxide-semiconductor field-effect transistor (MOSFET) are obtained by solving Poisson's equation. The analytic expressions for the electric potential and the threshold voltage are obtained by taking into account the short-channel effects. Our analytic results fit with other numerical and simulated results quite well. The analytic expressions will be of great help in ultralarge-scale integrated-circuit (ULSI) design.
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