Investigation of spurious resonances in thin film bulk acoustic wave resonators

S. Ballandras,A. Reinhardt,M. Solal,W. Steichen,V. Laude
DOI: https://doi.org/10.1109/ULTSYM.2004.1418151
2004-08-23
Abstract:A finite element analysis is performed to simulate thin film bulk acoustic wave (FBAR) structures, and a coupled finite element analysis/boundary integral method (FEA/BIM) is used to simulate accurately a radiation medium, like a Bragg mirror underneath a resonator, without having to mesh it entirely. Displacement fields are extracted from these calculations and analysed. In particular, dispersion curves are obtained by a Fourier analysis of these fields and are used to explain phenomena arising at electrode edges, like standing wave resonances under the electrodes or mode conversions.
Physics,Engineering
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