Comparison of different sensor thicknesses and substrate materials for the monolithic small collection-electrode technology demonstrator CLICTD

K. Dort,R. Ballabriga,J. Braach,E. Buschmann,M. Campbell,D. Dannheim,L. Huth,I. Kremastiotis,J. Kröger,L. Linssen,M. Munker,W. Snoeys,S. Spannagel,P. Švihra,T. Vanat
DOI: https://doi.org/10.1016/j.nima.2022.167413
2022-10-11
Abstract:Small collection-electrode monolithic CMOS sensors profit from a high signal-to-noise ratio and a small power consumption, but have a limited active sensor volume due to the fabrication process based on thin high-resistivity epitaxial layers. In this paper, the active sensor depth is investigated in the monolithic small collection-electrode technology demonstrator CLICTD. Charged particle beams are used to study the charge-collection properties and the performance of devices with different thicknesses both for perpendicular and inclined particle incidence. In CMOS sensors with a high-resistivity Czochralski substrate, the depth of the sensitive volume is found to increase by a factor two in comparison with standard epitaxial material and leads to significant improvements in the hit-detection efficiency and the spatial and time resolution.
What problem does this paper attempt to address?