Abstract:The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its unprecedented ability to locally probe electromechanically responsive materials with spatial resolution from microns to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM) there has been a rise in reports of nanoscale electromechanical functionality, including hysteresis, in materials that should be incapable of exhibiting piezo- or ferroelectricity. Explanations for the origins of unexpected nanoscale phenomena have included new material properties, surface-mediated polarization changes and/or spatially resolved behavior that is not present in bulk measurements. At the same time, it is well known that VM-AFM measurements are susceptible to numerous forms of crosstalk and, despite efforts within the AFM community, a global approach for eliminating this has remained elusive. In this work, we develop a method for easily demonstrating the presence of hysteretic (ie, false ferroelectric) long-range interactions between the sample and cantilever body. This method should be easy to implement in any VM-AFM measurement. We then go on to demonstrate fully quantitative and repeatable nanoelectromechanical characterization using an interferometer. These quantitative measurements are critical for a wide range of devices including mems actuators and sensors, memristor, energy storage and memory.

Intermodulation electrostatic force microscopy for imaging surface photo-voltage

Nanoscale Imaging of Surface Topography and Reactivity with the Scanning Electrochemical Microscope

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping

Spatially Resolved High Voltage Kelvin Probe Force Microcopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

Surface Potential Modeling and Reconstruction in Kelvin Probe Force Microscopy

Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping (Small 37/2021)

Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy

Electric Force Microscopy, Surface Potential Imaging, and Surface Electric Modification with the Atomic Force Microscope (AFM)

Kelvin Probe Force Microscopy and Its Application

Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

Simultaneous quantitative imaging of surface and magnetic forces

Nonresonant detection of electric force gradients by dynamic force microscopy

Quantitative Electrostatic Force Measurement and Characterization Based on Oscillation Amplitude Using Atomic Force Microscopy

Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions

Excluding Contact Electrification in Surface Potential Measurement Using Scanning Kelvin Probe Microscopy.

Quantitative Electromechanical Atomic Force Microscopy

Discrimination and analysis of interactions in non-contact Scanning Force Microscopy