Interfacial structures and mechanical properties of Cu/Sn/Cu containing SiC nanowires under transient liquid phase bonding

Mu-lan Li,Liang Zhang,Li-li Gao,Xi Wang,Chen Chen,Xiao Lu
DOI: https://doi.org/10.1016/j.intermet.2022.107641
IF: 4.075
2022-09-01
Intermetallics
Abstract:In order to achieve low-temperature bonding and high-temperature service, Cu/Sn/Cu and Cu/Sn-0.6SiC/Cu structure were fabricated by transient liquid phase (TLP) bonding, and the microstructure evolution of intermetallic compound (IMC) and mechanical performance of TLP bonding solder joints were investigated. The results demonstrated that the scalloped Cu6Sn5 IMC and lamellar Cu3Sn IMC formed at Sn/Cu interface gradually grew up in both solder joints as the bonding time increased. The asymmetrical growth of IMC was formed on both sides at TLP solder joints interface, whereas the interfacial IMC growth rate of Cu/Sn-0.6SiC/Cu was smaller than that of Cu/Sn/Cu solder. After TLP bonding for 120 min, Cu/Sn/Cu structure was composed of total Cu6Sn5 and Cu3Sn IMC and Cu/Sn-0.6SiC/Cu structure still contained remaining Sn phase. SiC nanowires (SiC NWs) dispersed in the solder matrix could impede the growth path between Sn and Cu, so SiC NWs doped to Sn solder could slow down the IMC growth. Moreover, introducing SiC NWs could promote the shear strength of composite solder compared with Sn solder joints during TLP bonding.
materials science, multidisciplinary,chemistry, physical,metallurgy & metallurgical engineering
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