Fault-Tolerant Analysis of 5-level Modified T-type and Packed U Cell MLI

Yashwant Sawle,Vishal Rathore,Dhananjay Kumar,Hasmat Malik,Fausto Pedro García Márquez
DOI: https://doi.org/10.1080/00207217.2024.2312088
2024-02-16
International Journal of Electronics
Abstract:In this work, 5-level modified T-type and modified Packed-U-Cell (PUC) multilevel inverter (MLI) topologies are designed with reduced device count for the reliability analysis of the MLI under faulty conditions. This work aims to incorporate the fault either by loss of an individual switch or due to the loss of a single h-bridge leg. Also, the proposed T-type and PUC inverter have an inherent self-voltage balancing capability that reduces the complexity and enhances the circuit's reliability. First, the proposed topologies are simulated using Matlab/Simulink environment, and the results obtained are then compared with the conventional MLI. Finally, both MLIs are experimentally tested on a laboratory prototype as a proof of concept to validate the analytical developments.
engineering, electrical & electronic
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