In Situ Infrared Spectroscopic Monitoring and Characterization of the Growth of Polydopamine (PDA) Films

Guoguang Sun,Fengshuo Zu,Norbert Koch,Jörg Rappich,Karsten Hinrichs
DOI: https://doi.org/10.1002/pssb.201800308
2019-01-03
physica status solidi (b)
Abstract:Modern infrared (IR) spectroscopic methods as in situ IR spectroscopic ellipsometry (in situ IRSE) and the photothermal atomic force microscopy (AFM)‐IR technique are introduced as novel analysis methods for characterization of polydopamine (PDA) films. The visible (VIS) and IR ellipsometric studies serve for determination of thicknesses, IR optical constants and discussion of specific vibrational bands. The in situ IR ellipsometric studies (IRSE) of the thin film growth of polydopamine (PDA), a versatile material for bioactive surfaces, in tris(hydroxymethyl)aminomethane (Tris) buffer solution are used to monitor the time‐dependent growth process of a PDA film. Complementary methods as X‐ray photoelectron spectroscopy (XPS) and the nanoscale photothermal AFM‐IR technique give access to study chemical homogeneity of the probed spots. All of the results are in qualitative agreement and show up new analysis possibilities, even further work is required to resolve the open questions of the chemical structure of PDA films. As proof of principle reaction for biosensor applications the binding of thiol‐terminated molecules to the PDA film via Michael‐addition was investigated by in situ IRSE. In this paper, infrared spectroscopic ellipsometry (IRSE) technique is used to in situ monitor and characterize the growth of polydopamine (PDA) film on solid/liquid (silicon/solution) interface. The structure of PDA is proposed based on the results from IRSE, X‐ray photoelectron spectroscopy (XPS), and the possible application toward biosensors is also validated.
physics, condensed matter
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