Abstract:One of the great challenges of Scanning Tunneling Microscopy (STM) is the production of atomically sharp tips. Tungsten tips in Scanning Probe Microscope (SPM) and Atomic Force Microscope (AFM) are used instead of platinum and iridium (Pt/Ir) tips due to their high quality factor, mechanical stability and produced at low cost. In this work we carried out different experiments on 0.5 mm (0.02 inch) tungsten wire and obtained sharp and reproducible tungsten tips by simple electrochemical etching “Drop-Off” method and we have shown that tips reproduced have better properties i.e. tip diameter and cone angle than earlier. Moreover tips reproducibility is checked by selecting a sample or two from produced tips and experimental work is repeated to show whether the procedure is reproducible or not and as shown that tips production procedure is reproducible by analyzing them, so have best control on tip shape and optimized etching conditions are reported. Similarly tips are produced by varying different voltages and maintaining various concentration of solution constant i.e. 2 molar, 3 molar and 4 molar NaOH concentration of solution and comparison is made between different tips by measuring their cone angle and tip diameter from SEM and OM images. Cone angle and tip diameter are measured from SEM and OM images by using AutoCAD software whose procedure are shown below at experimental work. Finally we have produced atomically sharp tungsten tips by analyzing optical microscope (OM) images and scanning electron microscope (SEM) images and have recommended the optimum one to be used in SPM. KeywordsScanning Tunneling Microscopy, Scanning Probe Microscope, Tungsten Tips, Electrochemical Etching, Scanning Electron Microscope

Influence of recrystallization on stability of tungsten scanning tunneling microscope tips.

Recrystallization of tungsten wire for fabrication of sharp and stable nanoprobe and field-emitter tips.

The Influence of Crystal Defects on the Elastic Properties of Tungsten Metals

Effect of High Temperature Annealing on the Microstructure and Thermal Shock Resistance of Tungsten Coatings Grown by Chemical Vapor Deposition

Atomic Scale Stability of Tungsten-Cobalt Intermetallic Nanocrystals in Reactive Environment at High Temperature.

Influence of Surface Morphology and Microstructure on Performance of CVD Tungsten Coating under Fusion Transient Thermal Loads

High-Percentage Success Method for Preparing and Pre-Evaluating Tungsten Tips for Atomic-Resolution Scanning Tunneling Microscopy

Systematic Study of Electropolishing Technique for Improving the Quality and Production Reproducibility of Tungsten STM Probe

Microstructure, mechanical behaviour and fracture of pure tungsten wire after different heat treatments

Enhanced Tensile Ductility of Tungsten Microwires Via High-Density Dislocations and Reduced Grain Boundaries

Purification and crystallization of tungsten wires fabricated by focused-ion-beam-induced deposition

Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips

Electrodynamics - molecular dynamics simulations of the stability of Cu nanotips under high electric field

Surface Damage and Structure Evolution of Recrystallized Tungsten Exposed to Elm-Like Transient Loads

The Art of Electrochemical Etching for Preparing Tungsten Probes with Controllable Tip Profile and Characteristic Parameters

Phase-field simulations of the recrystallization and the mechanical property response in deformed tungsten

Enhancement of field emission characteristics of tungsten emitters by single-walled carbon nanotube modification

The Effect of Process Annealing on the Recrystallization of Lamp Grade Tungsten

Cleaning of tungsten tips for subsequent use as cold field emitters or STM probes

Experimental Investigation of Reproducible Electrochemical Etching Technique of Tungsten Probe at Domestic level for SPM

Recrystallization behavior of pure tungsten hot-rolled with high accumulated strain during annealing at 1250 C-1350 C