Abstract:One of the great challenges of Scanning Tunneling Microscopy (STM) is the production of atomically sharp tips. Tungsten tips in Scanning Probe Microscope (SPM) and Atomic Force Microscope (AFM) are used instead of platinum and iridium (Pt/Ir) tips due to their high quality factor, mechanical stability and produced at low cost. In this work we carried out different experiments on 0.5 mm (0.02 inch) tungsten wire and obtained sharp and reproducible tungsten tips by simple electrochemical etching “Drop-Off” method and we have shown that tips reproduced have better properties i.e. tip diameter and cone angle than earlier. Moreover tips reproducibility is checked by selecting a sample or two from produced tips and experimental work is repeated to show whether the procedure is reproducible or not and as shown that tips production procedure is reproducible by analyzing them, so have best control on tip shape and optimized etching conditions are reported. Similarly tips are produced by varying different voltages and maintaining various concentration of solution constant i.e. 2 molar, 3 molar and 4 molar NaOH concentration of solution and comparison is made between different tips by measuring their cone angle and tip diameter from SEM and OM images. Cone angle and tip diameter are measured from SEM and OM images by using AutoCAD software whose procedure are shown below at experimental work. Finally we have produced atomically sharp tungsten tips by analyzing optical microscope (OM) images and scanning electron microscope (SEM) images and have recommended the optimum one to be used in SPM. KeywordsScanning Tunneling Microscopy, Scanning Probe Microscope, Tungsten Tips, Electrochemical Etching, Scanning Electron Microscope

Experimental Investigation of Reproducible Electrochemical Etching Technique of Tungsten Probe at Domestic level for SPM