Influence of Substrate Temperature on the Properties of ZnTe:Cu Films Prepared by a Magnetron Co-Sputtering Method
Hongwei Li,Haofei Huang,Azhati Lina,Ke Tang,Zhuorui Chen,Zilong Zhang,Ke Xu,Keke Ding,Linjun Wang,Jian Huang
DOI: https://doi.org/10.1016/j.heliyon.2023.e23349
IF: 3.776
2024-01-01
Heliyon
Abstract:Copper-doped Zinc Tellurium (ZnTe:Cu) films were deposited on borosilicate glass using magnetron co-sputtering technique. The influence of the substrate temperature on the structural, morphological, optical and electrical properties of ZnTe:Cu films was investigated by X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), UV–Vis spectrophotometer and Hall effect measurement system. The results indicate that substrate temperature significantly affects the properties of the ZnTe:Cu films. When the substrate temperature increases from room temperature to 600 °C, the (111)-preferred orientation of ZnTe:Cu films is gradually replaced by the (220)-preferred orientation. At high substrate temperatures (≥500 °C), the CuxTe phase appears in the ZnTe:Cu films, resulting in higher carrier concentration (>1019 cm−3) and lower resistivity (<10−2 Ω cm) of the prepared films.