Exploring electronic features in monolayer and bilayer MX 2 (M = Hf, Zr; X = S, Se) structures under shear strain

Jinlin Bao,Guili Liu,Lu Yang,Feng Li,Zhonghua Yang,Guoying Zhang
DOI: https://doi.org/10.1016/j.mtcomm.2024.108962
IF: 3.8
2024-04-23
Materials Today Communications
Abstract:This study employed first-principles calculations to investigate the dynamic stability of monolayer, bilayer, and heterostructure systems of four MX 2 (M = Hf, Zr and X = S, Se) TMDCs, as well as the influence of shear strain on their electronic properties. The computed binding energies and phonon dispersions demonstrate the excellent dynamic stability of bilayer systems, while the small effective masses of electrons and holes in monolayer systems suggest high carrier mobility. Under shear strain, the bandgap size and type of monolayer MX 2 system and their vdW heterostructures are effectively modulated, transitioning to metallic behavior under certain strain conditions. Both types of heterostructures exhibit type-II band alignment, serving as direct bandgap semiconductors, facilitating effective electron-hole separation between different layers and thereby reducing recombination. This study elucidates the tunability of the electronic properties of monolayers, bilayers, and heterostructures of MX 2 systems under shear strain, which is important for expanding material functionalities and optimizing device performance.
materials science, multidisciplinary
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