Abstract:Symmetries in the intensity distributions of convergent‐beam electron diffraction (CBED) patterns are governed not only by the atomic structure of the unit cell but by the morphology of the diffracting specimen as a whole. A simple interpretation based on structural tilt projections and the multislice scattering theory may prove useful in extracting morphological information embedded in the presence or absence of CBED pattern symmetries for a wide range of applications, from 4D scanning transmission electron microscopy to bonding electron density studies in nano‐structured materials.This work presents observations of symmetry breakages in the intensity distributions of near‐zone‐axis convergent‐beam electron diffraction (CBED) patterns that can only be explained by the symmetry of the specimen and not the symmetry of the unit cell describing the atomic structure of the material. The specimen is an aluminium–copper–tin alloy containing voids many tens of nanometres in size within continuous single crystals of the aluminium host matrix. Several CBED patterns where the incident beam enters and exits parallel void facets without the incident beam being perpendicular to these facets are examined. The symmetries in their intensity distributions are explained by the specimen morphology alone using a geometric argument based on the multislice theory. This work shows that it is possible to deduce nanoscale morphological information about the specimen in the direction of the electron beam – the elusive third dimension in transmission electron microscopy – from the inspection of CBED patterns.

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