Abstract:This article presents internal error detection, correction, and latching (iEDCL), a designer-friendly, fully functional error detection and correction (EDAC) approach tailored for energy-efficient near-threshold systems capable of tolerating variations. It embeds error detection (ED), correction, and latching circuits within a flip-flop (FF) with an additional 15 transistors to monitor critical paths. Notably, iEDCL's error-aware capability remains stable despite clock latency and parasitic effects, relieving designers of extensive involvement and eliminating false errors. iEDCL is automatedly implemented in an ARM Cortex-M0 processor at 55 nm without extra architecture modifications, incurring only a 6.78% area overhead. An adaptive voltage scaling (AVS) loop enables automatic operation, achieving high energy efficiency beyond the point of the first failure while maintaining a predefined error rate. Measurement results obtained from different dies at various temperatures demonstrate significant energy savings achieved by the iEDCL processor, with up to 16.9% and 49.1% reductions compared to critical baseline and signoff designs, respectively, while maintaining a 5% error rate at a 16 MHz frequency. To the best of our knowledge, this article presents one of the first FF EDAC implementations fully operational without potential false errors at near-threshold voltages while enhancing energy efficiency.

Margin Elimination Through Timing Error Detection in a Near-Threshold Enabled 32-bit Microcontroller in 40-nm CMOS

Margin Elimination Through Timing Error Detection in a Near-Threshold Enabled 32-bit Microcontroller in 40-nm CMOS

Negative Design Margin Realization through Deep Path Activity Detection Combined with Dynamic Voltage Scaling in a 55 nm Near-Threshold 32-Bit Microcontroller

Margin Elimination in a 55 nm Near-Threshold Microcontroller with Adaptive Prediction Capability and Voltage Scaling

Eliminating Timing Errors Through Collaborative Design to Maximize the Throughput

A Near Threshold Error Resilient Processor Based on Dynamic Timing Error Prediction and Within-a-cycle Timing Error Correction

A Timing Failure Tolerance Design with In-Field Simultaneous Error Detection and Correction.

A Variation-Tolerant Near-Threshold Processor with Instruction-Level Error Correction

iEDCL: Streamlined, False-Error-Free Error Detection and Correction Scheme in a Near-Threshold Enabled 32-bit Processor

An Energy-Efficient Microprocessor Using Multilevel Error Correction For Timing Error Tolerance

A Metastability-Immune Error-Resilient Flip-Flop for Near-Threshold Variation-Tolerant Designs

Ultra Low Overhead Error Mask Flip-Flop in Near Threshold Voltage Processor Design

Timing error resilient clock gate design for wide-voltage application

Light-Weight One-Cycle Timing Error Correction Based On Hardware Software Co-Design

Error Cancellation Flip-Flop Design with Lightweight In-Situ Error Correction

A new error masking flip-flop with one cycle correction penalty

Edsu: Error Detection And Sampling Unified Flip-Flop With Ultra-Low Overhead

Error-Resilient Integrated Clock Gate for Clock-Tree Power Optimization on a Wide Voltage IOT Processor

A Light-Weight Energy-Efficient Resilient Circuit for Variation Tolerance

A Timing-Aware Configurable Adder Based on Timing Detection for Low-Voltage Computing

25.8 A Near- Threshold-Voltage Network-on-Chip with a Metastability Error Detection and Correction Technique for Supporting a Quad-Voltage/Frequency-Domain Ultra-Low-Power System-on-a-Chip.