Abstract:Over the recent years X-ray differential phase-contrast imaging was developed for the hard X-ray regime as produced from laboratory X-ray sources. The technique uses a grating-based Talbot-Lau interferometer and was shown to yield image contrast gain, which makes it very interesting to the fields of medical imaging and non-destructive testing, respectively. In addition to X-ray attenuation contrast, the differential phase-contrast and dark-field images provide different structural information about a specimen. For the dark-field even at length scales much smaller than the spatial resolution of the imaging system. Physical interpretation of the dark-field information as present in radiographic and tomographic (CT) images requires a detailed look onto the geometric orientation between specimen and the setup. During phase-stepping the drop in intensity modulation, due to local scattering effects within the specimen is reproduced in the dark-field signal. This signal shows strong dependencies on micro-porosity and micro-fibers if these are numerous enough in the object. Since a grating-interferometer using a common unidirectional line grating is sensitive to X-ray scattering in one plane only, the dark-field image is influenced by the fiber orientations with respect to the grating bars, which can be exploited to obtain anisotropic structural information. With this contribution, we attempt to extend existing models for 2D projections to 3D data by analyzing dark-field contrast tomography of anisotropically structured materials such as carbon fiber reinforced carbon (CFRC).

Simulations of dislocation contrast in dark‐field X‐ray microscopy

Computing virtual dark-field X-ray microscopy images of complex discrete dislocation structures from large-scale molecular dynamics simulations

Automating Dislocation Characterization in 3D Dark Field X-ray Microscopy

A coherent way to image dislocations

Measuring the Burgers Vector of Dislocations with Dark-Field X-ray Microscopy

X-ray Free Electron Laser based Dark-Field X-ray Microscopy

Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection

Formalism to Image the Dynamics of Coherent and Incoherent Phonon with Dark-Field X-ray Microscopy using Kinematic Diffraction Theory

Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope

High-Resolution Scanning X-ray Diffraction Microscopy

Application of laboratory micro X-ray fluorescence devices for X-ray topography

Diffraction contrast in reflection electron microscopy—I. Screw dislocation

Multiple scattering simulation of electron channelling contrast images of dislocations at interfaces

3D Reconstruction of the Spatial Distribution of Dislocation Loops Using an Automated Stereo-Imaging Approach

Projection angle dependence in grating-based X-ray dark-field imaging of ordered structures

Spatially resolved mapping of coherent twin relationships in DFXM measurements

Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser

3D reconstruction of the spatial distribution of dislocation loops using a triangulation approach

Detection of dislocation motion in atomistic simulations of nanocrystalline materials

Digital Dark Field -- Higher Contrast and Greater Specificity Dark Field Imaging using a 4DSTEM Approach

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers