Abstract:It has become apparent through experimentation at the micro- and nanolevels that the crystalline defects known as dislocations have significant effects on a material’s properties. Accordingly, a complete material state description must include the characterization of the dislocated state. However, this characterization presents a twofold problem: resolution and representation. In general, high-resolution microscopy techniques are only useful for considering a few dislocations at a time, but automated high-speed methods are only capable of resolving dislocation densities well above the average density in a typical annealed metal. The second challenge is developing a method of representation for the dislocated state. Unlike most state quantities, dislocation lengths are not conserved and complete representation would require tracking of position, momentum, and interactions, as well as the creation and annihilation of dislocations. Such a scheme becomes unwieldy when considering the large numbers of dislocations involved in common crystal plasticity. In 1970, Kröner (“Initial Studies of a Plasticity Theory Based Upon Statistical Mechanics,” Inelastic Behaviors of Solids (Materials Sciences and Engineering), M. F. Kanninen et al., eds., McGraw-Hill, New York, pp. 137–147), a pioneer in the continuum representation of dislocations, proposed a statistical method using n-point correlations to classify the dislocated state in a compact form. In addition to providing a convenient form, the correlations naturally identify dipoles, multipoles, and other higher order structures, such as cells, networks, and braids. As formulated, Kröner’s method would require high-resolution microscopy techniques, which limits its utility for experimental measurements. The current work presents a modification to Kröner’s method that would allow it to be used within the currently available resolution limits of bulk microscopy. Furthermore, in this work, newly developed microscopy techniques are employed to refine those resolution limits to more significant levels. The high-resolution bulk dislocation characterization is applied to a well-annealed nickel specimen and the results including visualizations of mesoscale structures are presented.

A coherent way to image dislocations

Three-dimensional imaging of dislocation propagation during crystal growth and dissolution

Nano-scale imaging of the full strain tensor of specific dislocations extracted from a bulk sample

High-Resolution Scanning X-ray Diffraction Microscopy

Tracking defects of Electronic Crystals by Coherent X-ray Diffraction

Computing virtual dark-field X-ray microscopy images of complex discrete dislocation structures from large-scale molecular dynamics simulations

Towards a quantitative determination of strain in Bragg Coherent X-ray Diffraction Imaging: artefacts and sign convention in reconstructions

Full, 3D-Resolved Lattice Strain Tensor Measurements of Specific Crystallographic Defects Extracted from a Bulk Sample

Simulations of dislocation contrast in dark‐field X‐ray microscopy

Formalism to Image the Dynamics of Coherent and Incoherent Phonon with Dark-Field X-ray Microscopy using Kinematic Diffraction Theory

Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope

Application of laboratory micro X-ray fluorescence devices for X-ray topography

High-Resolution Methods for Characterizing Mesoscale Dislocation Structures

An algorithm for Bragg coherent x-ray diffractive imaging of highly strained nanocrystals

Coherent diffractive imaging with twisted X-rays: Principles, applications, and outlook

Automating Dislocation Characterization in 3D Dark Field X-ray Microscopy

Intermitted 3D diffraction tomography combined with in situ Laue diffraction to characterize dislocation structures and stress fields in micro bending cantilevers

Bragg coherent diffractive imaging for defects analysis: Principles, applications, and challenges

Spin density wave dislocation in chromium probed by coherent x-ray diffraction

Selective coherent x-ray diffractive imaging of displacement fields in (Ga,Mn)As/GaAs periodical wires

Dynamic X-ray Coherent Diffraction Analysis: Bridging the Time Scales between Imaging and Photon Correlation Spectroscopy