Statistical Analysis of Signal Integrity Issues in CNT Interconnects due to Contact Resistance Variations

J. Raina,A. Sam,N. Kuruvilla
Abstract:Carbon nanotubes have recently been proposed as a possible replacement of metal interconnects in future technologies. These interconnects are supposed to carry signal frequencies above 20GHz by the year 2020. Hence signal integrity analysis is inevitable under real life process conditions. Contact resistance of CNT interconnects are reported to be varying between 0KΩ to 120KΩ. However, no study has been extensively analysed its effect on signal integrity issues for these interconnects. This work aims to fill that gap by Statistical analysis of the impact of contact resistance variations on signal integrity issues of bundles of SWCNTs. This work revealed that the signal integrity issues due to contact resistance variations are more severely effecting signal timing variations than the crosstalk induced signal overshoots and undershoots.
Materials Science,Engineering,Physics
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