Abstract:Two new routines for the refinement of uranium dispersion corrections from anomalous powder diffraction data, using either the intensity of some reflections or full‐pattern Rietveld refinement, are reported. These methods advance the application of diffraction anomalous fine structure on uranium compounds, and open up new possibilities for the assessment of complex materials such as mixed‐valence compounds.The evolution of the uranium chemical state in uranium compounds, principally in the oxides, is of concern in the context of nuclear fuel degradation under storage and repository conditions, and in accident scenarios. The U–O system shows complicated phase relations between single‐valence uranium dioxide (UO2) and different mixed‐valence compounds (e.g. U4O9, U3O7 and U3O8). To try resolving the electronic structure associated with unique atomic positions, a combined application of diffraction and spectroscopic techniques, such as diffraction anomalous fine structure (DAFS), can be considered. Reported here is the application of two newly developed routines for assessing a DAFS data set, with the aim of refining the uranium X‐ray dispersion corrections. High‐resolution anomalous diffraction data were acquired from polycrystalline powder samples of UO2 (containing tetravalent uranium) and potassium uranate (KUO3, containing pentavalent uranium) using synchrotron radiation in the vicinity of the U L3 edge (17.17 keV). Both routines are based on an iterative refinement of the dispersion corrections, but they differ in either using the intensity of a selection of reflections or doing a full‐pattern (Rietveld method) refinement. The uranium dispersion corrections obtained using either method are in excellent agreement with each other, and they show in great detail the chemical shifts and differences in fine structure expected for tetravalent and pentavalent uranium. This approach may open new possibilities for the assessment of other, more complicated, materials such as mixed‐valence compounds. Additionally, the DAFS methodology can offer a significant resource optimization because each data set contains both structural (diffraction) and chemical (spectroscopy) information, which can avoid the requirement to use multiple experimental stations at synchrotron sources.

[Influence of the Experiment Energy Dispersive X-Ray Fluorescence Measurement of Uranium by Different Excitation Source]

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