Precision determination of the track-position resolution of beam telescopes

M. Antonello,L. Eikelmann,E. Garutti,R. Klanner,J. Schwandt,G. Steinbrück,A. Vauth

2024-08-30

Abstract:Beam tests using tracking telescopes are a standard method for determining the spatial resolution of detectors. This requires the precise knowledge of the position resolution of beam tracks reconstructed at the Device Under Test (DUT). A method is proposed which achieves this using a segmented silicon detector with readout with charge digitization. It is found that the DUT spatial resolution for particles with normal incidence is less than 1 $\mu$m for events where clusters consist of two pixels (or strips). Given this accuracy, the residual of the beam track-position at the DUT and the position reconstructed in the DUT provides the beam track-position resolution distribution. The method is developed using simulated events, which are also used to study how to deal with cross-talk, electronics noise, energetic $\delta $-electrons, and incident beams with a few degrees off the normal to the sensor plane. To validate the method, the position resolution of beam tracks reconstructed by the EUDET beam telescope of the DESY II Test Beam Facility is determined using a CMS Phase-2 prototype pixel sensor.

Instrumentation and Detectors

What problem does this paper attempt to address?

The problem that this paper attempts to solve is how to accurately determine the track - position resolution of beam telescopes in detector tests. Specifically, the researchers proposed a method to directly determine the track - position resolution from experimental data by using the charge - digitized data read out from segmented silicon detectors. This method is especially suitable for normally incident particle beams.

### Background and Motivation

In high - energy physics experiments, beam tests are a commonly used experimental method to determine the spatial resolution of segmented silicon detectors. This is usually achieved by measuring the residuals between the track positions extrapolated from the beam telescope to the Device Under Test (DUT) and the positions reconstructed in the DUT. In order to accurately extract the spatial resolution of the DUT from these residuals, the track - position resolution needs to be known precisely. However, traditional measurement methods have some limitations, such as different resolutions of upstream and downstream telescopes, simulation errors, etc.

### Proposed Method

The method proposed in the paper takes advantage of the fact that the spatial resolution of normally incident particles at the pixel boundaries is less than 1 micrometer. The specific steps are as follows:

1. **Select Events**: Select those events that form two - pixel (or strip) clusters in the DUT.
2. **Calculate Charge Asymmetry**: For each selected event, calculate the charge asymmetries \(\eta_x\) and \(\eta_y\) between the two pixels:
\[
\eta_x=\frac{Q_{x2}-Q_{x1}}{Q_{x1}+Q_{x2}}
\]
where \(Q_{x1}\) and \(Q_{x2}\) are the amounts of charge in the pixels with lower and higher \(x\) - coordinates respectively. The treatment in the \(y\) - direction is similar.
3. **Determine Reconstructed Position**: Take the boundary between the two pixels as the reconstructed positions \(x_{\text{DUT}}\) and \(y_{\text{DUT}}\).
4. **Analyze Residuals**: Calculate the residuals \(\Delta x = x_{\text{DUT}}-x_{\text{true}}\) and \(\Delta y=y_{\text{DUT}}-y_{\text{true}}\), where \(x_{\text{true}}\) and \(y_{\text{true}}\) are the true values provided by the simulation.
5. **Correction**: Correct the residuals by fitting a third - order polynomial to reduce the effects of charge diffusion and other effects.

### Verification and Application

The researchers verified the effectiveness of this method using simulated data and actual beam test data. The experimental data came from the DESY II test beam line facility, and the sensor used was the CMS Phase - 2 prototype pixel sensor. The results show that this method can achieve a track - position resolution of about 1 micrometer or less, and is highly robust against influencing factors such as cross - coupling, electronic noise, high - energy delta electrons, and incident angle deviations.

### Conclusion

The method proposed in this paper provides a new way to accurately measure the track - position resolution of beam telescopes, especially for segmented silicon detectors. By selecting an appropriate charge - asymmetry interval, the spatial resolution can be further improved to below 0.5 micrometer. In addition, this method has good robustness against influencing factors under various experimental conditions and is suitable for a variety of application scenarios.