Simultaneous Measurement of Thermal Conductivity and Heat Capacity Across Diverse Materials Using the Square-Pulsed Source (SPS) Technique

Tao Chen,Shangzhi Song,Yang Shen,Kexin Zhang,Puqing Jiang

2024-05-31

Abstract:State-of-the-art techniques like dual-frequency Time-Domain Thermoreflectance (TDTR) and Frequency-Domain Thermoreflectance (FDTR) offer superb capability for simultaneous measurements of thermal conductivity and heat capacity with a spatial resolution on the order of 10 {\mu}m. However, their applicability is limited to highly conductive materials with an in-plane thermal conductivity exceeding 10 W/(m*K). In this paper, we introduce the Square-Pulsed Source (SPS) technique, offering a novel approach to concurrently measure thermal conductivity and heat capacity with a 10 {\mu}m spatial resolution, while significantly extending the measurable thermal conductivity range to an unprecedented low of 0.1 W/(m*K), offering enhanced versatility. To demonstrate and validate its efficacy, we conducted measurements on various standard materials--PMMA, silica, sapphire, silicon, and diamond--spanning a wide thermal conductivity range from 0.1 to 2000 W/(m*K). The obtained results exhibit remarkable agreement with literature values, with a typical measurement uncertainty of less than 10% across the entire thermal conductivity range. By providing a unique capability to characterize both highly and lowly conductive materials with micron-scale spatial resolution, the SPS method opens new avenues for understanding and engineering thermal properties across diverse applications.

Applied Physics

What problem does this paper attempt to address?

This paper mainly introduces a new technique called Square-Pulsed Source (SPS), which is used to simultaneously measure the thermal conductivity (\(k\)) and specific heat capacity (\(C\)) of various materials with micrometer-level spatial resolution. Although existing dual-frequency time-domain thermoreflectance (TDTR) and frequency-domain thermoreflectance (FDTR) techniques can also measure these two parameters simultaneously, their application is limited to high-conductive materials with a planar thermal conductivity exceeding 10 W/(m∙K). The SPS technology extends the measurable range of thermal conductivity to an unprecedented low value of 0.1 W/(m∙K), greatly enhancing its applicability.

By applying a square wave modulated pump laser with a 50% duty cycle on the sample surface and using another laser to capture the temperature response, the SPS technology can achieve simultaneous measurement of \(k\) and \(C\). Experimental results show good consistency with literature values in a wide range of thermal conductivity from 0.1 to 2000 W/(m∙K), with measurement uncertainties typically less than 10%.

The paper describes in detail the working principle, experimental setup, thermal model, and measurement methods of \(k\) and \(C\) under different thermal conduction modes of the SPS technology. The effectiveness and wide applicability of the SPS technology are validated by experiments on standard materials such as PMMA, quartz, sapphire, silicon, and diamond.

The breakthrough of this technology lies in overcoming the limitations of traditional methods in measuring low-conductive materials, providing new avenues for understanding and engineering the thermal properties in various applications, especially in the characterization of thermal properties of materials at the micrometer scale.