A Laser Phase Plate for Transmission Electron Microscopy

Jeremy J. Axelrod
2024-03-16
Abstract:Low image contrast is a major limitation in transmission electron microscopy, since samples with low atomic number only weakly phase-modulate the illuminating electron beam, and beam-induced sample damage limits the usable electron dose. The contrast can be increased by converting the electron beam's phase modulation into amplitude modulation using a phase plate, a device that applies a $\pi/2$ radian phase shift to part of the electron beam after it has passed through the sample. Previous phase plate designs rely on material placed in or near the electron beam to provide this phase shift. This results in image aberrations, an inconsistent time-varying phase shift, and resolution loss when the electron beam charges, damages, or is scattered from the material.
Instrumentation and Detectors,Applied Physics,Optics,Biomolecules
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