Probing the graphene/substrate interaction by electron tunneling decay

Virginia Carnevali,Alessandro Sala,Pietro Biasin,Mirco Panighel,Giovanni Comelli,Maria Peressi,Cristina Africh
DOI: https://doi.org/10.1016/j.carbon.2023.118055
2023-04-28
Abstract:The electronic properties of graphene can be modified by the local interaction with a selected metal substrate. To probe this effect, Scanning Tunneling Microscopy is widely employed, particularly by means of local measurement via lock-in amplifier of the differential conductance and of the field emission resonance. In this article we propose an alternative, reliable method of probing the graphene/substrate interaction that is readily available to any STM apparatus. By testing the tunneling current as function of the tip/sample distance on nanostructured graphene on Ni(100), we demonstrate that I(z) spectroscopy can be quantitatively compared with Density Functional Theory calculations and can be used to assess the nature of the interaction between graphene and substrate. This method can expand the capabilities of standard STM systems to study graphene/substrate complexes, complementing standard topographic probing with spectroscopic information.
Mesoscale and Nanoscale Physics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is: how to detect the interaction between graphene and the substrate through a simple and reliable method, especially to distinguish the strong - interaction and weak - interaction regions on the nanoscale. Specifically, the authors proposed a tunneling - current - attenuation (I(z)) spectroscopy method based on scanning tunneling microscopy (STM) to quantitatively evaluate the interaction between graphene and metal substrates (such as Ni(100) and Ir(100)). ### Specific description of the problem: 1. **Background**: - The electronic properties of graphene can be modified by its local interaction with selected metal substrates. - Traditional scanning tunneling microscopy (STM) can study this interaction by measuring differential conductance (dI/dV) or field - emission resonance, but these methods usually require specialized equipment (such as a lock - in amplifier) and a low - temperature environment (such as liquid - helium cooling). 2. **Existing challenges**: - Traditional methods require complex equipment and techniques, which limit their wide application. - A simpler and more general method is needed to detect the interaction between graphene and the substrate, especially a method that can be implemented in a standard STM system. 3. **Solution**: - The authors proposed a new method, that is, by measuring the change of tunneling current with tip/sample distance (z) (I(z) spectroscopy), to detect the interaction between graphene and the substrate. - This method does not require additional electronic equipment and can be implemented in any basic STM system. 4. **Objective**: - Verify the effectiveness of I(z) spectroscopy through experiments and theoretical calculations (density - functional theory, DFT). - Demonstrate that this method can be used to quantitatively describe the interaction strength of different graphene/substrate systems and expand the functions of the STM system so that it is not only limited to topological imaging but also can provide spectral information. ### Conclusion: This method can obtain reliable spectral information through simple STM measurements, thereby quantitatively describing the interaction strength between graphene and metal substrates. The experimental results show that I(z) spectroscopy can distinguish the graphene regions with strong interaction and weak interaction, and are consistent with the theoretical calculation results. In addition, this method has also been verified in other graphene/substrate systems (such as Ir(100)), showing broad application potential.