Giant flexoelectric effect in ferroelectric epitaxial thin films

D Lee,A Yoon,S Y Jang,J-G Yoon,J-S Chung,M Kim,J F Scott,T W Noh
DOI: https://doi.org/10.1103/PhysRevLett.107.057602
2011-07-29
Abstract:We report on nanoscale strain gradients in ferroelectric HoMnO(3) epitaxial thin films, resulting in a giant flexoelectric effect. Using grazing-incidence in-plane x-ray diffraction, we measured strain gradients in the films, which were 6 or 7 orders of magnitude larger than typical values reported for bulk oxides. The combination of transmission electron microscopy, electrical measurements, and electrostatic calculations showed that flexoelectricity provides a means of tuning the physical properties of ferroelectric epitaxial thin films, such as domain configurations and hysteresis curves.
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