Performance Prediction of InP/GaAsSb Double Heterojunction Bipolar Transistors for THz applications

Xin Wen,Akshay Arabhavi,Wei Quan,Olivier Ostinelli,Chhandak Mukherjee,Marina Deng,Sébastien Frégonèse,Thomas Zimmer,Cristell Maneux,Colombo R. Bolognesi,Mathieu Luisier
DOI: https://doi.org/10.1063/5.0054197
2021-07-19
Abstract:The intrinsic performance of "type-II" InP/GaAsSb double heterojunction bipolar transistors (DHBTs) towards and beyond THz is predicted and analyzed based on a multi-scale technology computer aided design (TCAD) modeling platform calibrated against experimental measurements. Two-dimensional hydrodynamic simulations are combined with 1-D full-band, atomistic quantum transport calculations to shed light on future DHBT generations whose dimensions are decreased step-by-step, starting from the current device configuration. Simulations predict that a peak transit frequency $f_{T,peak}$ of around 1.6 THz could be reached in aggressively scaled type-II DHBTs with a total thickness of 256 nm and an emitter width $W_E$ of 37.5 nm. The corresponding breakdown voltage $BV_{CEO}$ is estimated to be 2.2 V. The investigations are put in perspective with two DHBT performance limiting factors, self-heating and breakdown characteristics.
Applied Physics,Materials Science
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