SiC based beam monitoring system for particle rates from kHz to GHz

Simon Waid,Andreas Gsponer,Jürgen Burin,Philipp Gaggl,Richard Thalmeier,Thomas Bergauer
DOI: https://doi.org/10.1088/1748-0221/19/04/c04055
2024-04-26
Journal of Instrumentation
Abstract:The extremely low dark current of silicon carbide (SiC) detectors, even after high-fluence irradiation, was utilized to develop a beam monitoring system for a wide range of particle rates, i.e., from the kHz to the GHz regime. The system is completely built from off-the-shelf components and is focused on compactness and simple deployment. Beam tests using a 50 um thick SiC detector reveal, that for low fluences, single particles can be detected and counted. For higher fluences, beam properties were extracted from beam cross sections using a silicon strip detector. Overall, accurate results were achieved up to a particle rate of 10 9 particles per second.
instruments & instrumentation
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