PRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

S. Jena,R. B. Tokas,S. Thakur,D. V. Udupa
DOI: https://doi.org/10.1088/2632-959X/abd967
2020-11-10
Abstract:A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator energy and dispersion energy), absorption co-efficient, band gap and thickness of semiconductor and dielectric thin films from their measured transmission spectrum, only. The thickness, refractive index, and extinction co-efficient of the films have been derived using Envelope method proposed by Swanepoel. The absorption co-efficient in the strong absorption region is calculated using the method proposed by Connel and Lewis. Subsequently, both direct and indirect bandgap of the films is estimated from the absorption co-efficient spectrum using Tauc plot. The codes for the software are written in Python and the graphical user interface is programmed with tkinter package of Python. It provides convenient input and output of the measured and derived data. The software has a feature to retrieve transmission spectrum using the derived parameters in order to check their reliability. The performance of the software is verified by analyzing numerically generated transmission spectra of a-Si:H amorphous semiconductor thin films, and experimentally measured transmission spectra of electron beam evaporated HfO2 dielectric thin films as examples. PRISA is found to be much simpler and accurate as compared to the other freely available softwares. To help other researchers working on thin films, the software is made freely available at <a class="link-external link-https" href="https://www.shuvendujena.tk/download" rel="external noopener nofollow">this https URL</a>.
Materials Science,Optics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is to develop a simple - to - use software PRISA for determining the optical constants (refractive index and extinction coefficient), dispersion parameters (oscillator energy and dispersion energy), absorption coefficient, band gap and thickness of semiconductor and dielectric thin films from the measured transmission spectra. Specifically, the PRISA software uses the envelope method proposed by Swanepoel to derive the thickness, refractive index and extinction coefficient of the thin film; uses the method proposed by Connel and Lewis to calculate the absorption coefficient in the strong absorption region; and estimates the direct and indirect band gaps of the thin film from the absorption coefficient spectrum through the Tauc plot. In addition, the software also has the function of recovering the transmission spectrum from the derived parameters to check the reliability of these parameters. The main features of the PRISA software include: 1. **Simplicity**: The software is simply designed and user - friendly, suitable for scientific researchers to use. 2. **Accuracy**: Compared with other free software, PRISA shows higher accuracy in the tests. 3. **Comprehensive functions**: In addition to the basic optical constants, it can also calculate the dispersion energy parameters, Tauc plot and band gap, which are not available in many existing software. 4. **Open - source and free**: To help other researchers studying thin films, the software is provided for free download. The performance and reliability of the PRISA software are verified by analyzing the transmission spectra of numerically generated a - Si:H amorphous silicon thin films and experimentally measured HfO2 dielectric thin films. The results show that PRISA can accurately derive the optical parameters of the thin film and highly match the original data when recovering the transmission spectrum.